The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2011
Filed:
Jan. 13, 2009
Gwo-huei Wu, Pan-Chiao, TW;
Hsiang-ji Hsieh, Jhubei, TW;
Chih-yuan Chen, Hsin-Chu, TW;
Chao-ming Huang, Hsin-Tien, TW;
Gwo-Huei Wu, Pan-Chiao, TW;
Hsiang-Ji Hsieh, Jhubei, TW;
Chih-Yuan Chen, Hsin-Chu, TW;
Chao-Ming Huang, Hsin-Tien, TW;
Mediatek, Inc., Hsinchu, TW;
Abstract
A method and an apparatus for deciding a spherical aberration compensation (SAC) value for an optical storage medium are provided. The optical storage medium comprises at least one recording layer and a cover layer. The SAC value is suitable for a selected one of the at least one recording layer. First, a focus search on the optical storage medium is performed to derive a focus error (FE) signal in response to a testing SAC value. Then, a center level and a center basis corresponding to the testing SAC value according to the FE signal is determined. The SAC value according to the center level, the center basis, and the testing SAC value is also determined. When the center level and the center basis are equal, the SAC value is determined to be the testing SAC value.