The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2011

Filed:

Jun. 12, 2009
Applicants:

Malcolm C. Smith, Winchester, MA (US);

Michael A. Butler, Windham, NH (US);

Erik Deutsch, Brookline, MA (US);

Inventors:

Malcolm C. Smith, Winchester, MA (US);

Michael A. Butler, Windham, NH (US);

Erik Deutsch, Brookline, MA (US);

Assignee:

Ahura Scientific Inc., Wilmington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G02B 26/08 (2006.01); G02B 26/10 (2006.01); G02B 26/12 (2006.01); G02B 5/18 (2006.01); G02B 27/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

An adjustable two-dimensional lamellar grating system including a lamellar grating and a movable mirror disposed substantially parallel to one another, and an interferometer using the adjustable lamellar grating system. In one example, the lamellar grating includes a dielectric wafer having a dielectric wafer having a plurality of periodically spaced recesses formed therein, wherein the dielectric wafer has higher reflectivity at its surface facing the movable mirror than at a second opposing surface. In one example, the system also includes a mechanism for moving the mirror relative to the dielectric wafer.


Find Patent Forward Citations

Loading…