The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2011
Filed:
Mar. 30, 2009
Masud Azimi, Belmont, MA (US);
Arran Bibby, Savannah, GA (US);
Christopher D. Brown, Haverhill, MA (US);
Peili Chen, Andover, MA (US);
Kevin J. Knopp, Newburyport, MA (US);
Daryoosh Vakhshoori, Cambridge, MA (US);
Peidong Wang, Carlisle, MA (US);
Stephen Mclaughlin, Andover, MA (US);
Masud Azimi, Belmont, MA (US);
Arran Bibby, Savannah, GA (US);
Christopher D. Brown, Haverhill, MA (US);
Peili Chen, Andover, MA (US);
Kevin J. Knopp, Newburyport, MA (US);
Daryoosh Vakhshoori, Cambridge, MA (US);
Peidong Wang, Carlisle, MA (US);
Stephen McLaughlin, Andover, MA (US);
Ahura Scientific Inc., Wilmington, MA (US);
Abstract
We disclose an apparatus comprising: a hand-portable optical analysis unit including an optical interface; and a device configured to receive and releasably engage the hand-portable optical analysis unit. The device comprises: a housing; a sample unit in the housing; and a resilient member configured to bias the sample unit and the hand-portable analysis unit towards each other when the hand-portable optical analysis unit is received in the device to compress a sample disposed between the sample unit and the optical interface of the optical analysis unit. Methods of analyzing samples are also disclosed.