The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2011
Filed:
Dec. 11, 2008
Ralph Thomas Hoctor, Saratoga Springs, NY (US);
Scott Stephen Zelakiewicz, Niskayuna, NY (US);
Evren Asma, Niskayuna, NY (US);
Ralph Thomas Hoctor, Saratoga Springs, NY (US);
Scott Stephen Zelakiewicz, Niskayuna, NY (US);
Evren Asma, Niskayuna, NY (US);
Morpho Detection, Inc., Newark, CA (US);
Abstract
An imaging system includes a platform having mounted thereon an imaging device. The imaging device includes a first detector and a second detector. The imaging system includes a mask having a first pattern of apertures therein, the mask positioned on a first side of the first detector, an anti-mask having a second pattern of apertures therein, wherein the second pattern is derived from the first pattern, the anti-mask positioned on a first side of the second detector, and a computer configured to acquire a plurality of mask datasets and anti-mask datasets of a gamma source, add one of the mask datasets and subtract its respective anti-mask dataset to create a far-field dataset, adjust the far-field image dataset, reconstruct a near-field image of the source using the far-field dataset, and apply an expectation maximization (EM) algorithm to one of the far-field image dataset and the near-field image to enhance contrast.