The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2011

Filed:

Feb. 12, 2008
Applicants:

Yoshiaki Satoh, Kaisei-machi, JP;

Tsuyoshi Shiina, Tsukuba, JP;

Inventors:

Yoshiaki Satoh, Kaisei-machi, JP;

Tsuyoshi Shiina, Tsukuba, JP;

Assignees:

Fujifilm Corporation, Tokyo, JP;

The University of Tsukuba, Tennodal, Tsukuba, unknown;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ultrasonic diagnostic apparatus by which IMT examination can be efficiently performed by simple processing in a health check. The ultrasonic diagnostic apparatus includes: a signal processing unit for performing at least envelope detection processing on reception signals outputted from an ultrasonic probe to generate envelope data; an image data generating unit for generating image data representing an ultrasonic image on an object to be inspected based on the envelope data; a pre-measurement processing part for performing structural image generating processing on the envelope data; and a measurement part for performing measurement based on the envelope data processed by the pre-measurement processing part.


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