The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
Dec. 03, 2007
Kazuhiko Taniguchi, Yokohama, JP;
Yoshiaki Isobe, Yokohama, JP;
Nariyasu Hamada, Inagi, JP;
Hiroyuki Shimizu, Kiyose, JP;
Kazuhiko Taniguchi, Yokohama, JP;
Yoshiaki Isobe, Yokohama, JP;
Nariyasu Hamada, Inagi, JP;
Hiroyuki Shimizu, Kiyose, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Inputted information (such as biometric information) is compared to template information (including correlation or authentication) and the result is recorded as log information. According to log information for each of the types of the inputted information (such as information specifying the user who has inputted it and the template), analysis is executed for the inputted information for each of the types. This analysis includes the following aspects. That is, the following states are detected and an alarm is outputted for the accuracy of the corresponding type: when the ratio of negative comparison results (correlation failures) not smaller than a predetermined value is detected within a predetermined period of time; and when a negative result is detected within a predetermined time before an affirmative comparison result is obtained.