The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
Oct. 11, 2005
Philip Lui, New York, NY (US);
Zbigniew Kopytnik, East Stroudsburg, PA (US);
David Rayna, Malverne, NY (US);
Philip Lui, New York, NY (US);
Zbigniew Kopytnik, East Stroudsburg, PA (US);
David Rayna, Malverne, NY (US);
Knoa Software, Inc., New York, NY (US);
Abstract
Presented is a system and method for monitoring events derived from a computer target application presentation layer including the steps of providing, independent of recompiling the target application's source code, a script running at a level within the target application. The script scans run-time instantiations of objects of the target application, and allocates structures in real-time to the object instantiations. These allocated structures are adapted to create a reflection of the target application structure, which is used along with detected object instantiations that match a predetermined object structure to capture a portion of an environmental spectrum of the detected object. Further, the system can process state machine events occurring on at least one of a server machine and a client/localized machine, correlate the state machine events with the environmental spectrum, and deduce a user experience based on the correlated state machine events.