The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
Jan. 26, 2009
Hiroaki Nakamura, Yokohama, JP;
Kohichi Ono, Wakabaya, JP;
Hiroaki Nakamura, Yokohama, JP;
Kohichi Ono, Wakabaya, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system, a computer readable article of manufacture, and a method for verifying operation of a target system to be inspected. The system includes an abstract binary tree generation unit and a matching unit. The abstract binary tree generation unit obtains information about a functional specification of the target system and generates one or more binary trees that associate one or more states that can occur in the target system with respective nodes and that associate state transitions of objects constituting the target system and interactions between the objects with connection relationships between the nodes. The matching unit receives an event sequence in an application model of the target system obtained in response to the operation of the target system and matches the event sequence against the binary trees generated by the abstract binary tree generation unit. The method includes steps for accomplishing the functionality of the system.