The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
Oct. 23, 2008
Kunal Desai, Foster City, CA (US);
Deena Philip, Belmont, CA (US);
Kunal Desai, Foster City, CA (US);
Deena Philip, Belmont, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques for identifying duplicate records in data to be imported into a data hub. In one set of embodiments, a batch of records to be imported into a data hub is received and a match rule for the batch of records is selected. The match rule includes a set of match criteria for matching records in the inbound batch to records stored in the data hub. A matching process is then carried out, prior to importing the batch of records, to determine whether any of the records in the batch are duplicates of records stored in the data hub. By identifying potential duplicate records before (rather than after) importation, the problems associated with prior art duplicate identification techniques are minimized or avoided. In a particular embodiment, an import workbench application comprising a plurality of user interface screens is provided for aiding a user in managing the matching process.