The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2011

Filed:

Apr. 25, 2007
Applicants:

Ailin Mao, Chino Hills, CA (US);

Anatole Lokshin, Huntington Beach, CA (US);

Nidhi Upparapalli, Diamond Bar, CA (US);

Inventors:

Ailin Mao, Chino Hills, CA (US);

Anatole Lokshin, Huntington Beach, CA (US);

Nidhi Upparapalli, Diamond Bar, CA (US);

Assignee:

Mitac International Corporation, Kuei San Hsiang, Taoyuan, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of determining density of a map is described along with an apparatus and computer-readable medium comprising instructions therefore. The method comprises determining one or more nodes of a quad tree applied to a map with which a predetermined query region intersects, calculating a cumulative data size of the query region based on a data size of the one or more intersecting nodes, and determining an average density of the query region based on the query region area and the cumulative data size.


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