The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2011

Filed:

Dec. 07, 2009
Applicants:

Chin-hsiung Chang, Tai-Chung, TW;

Fu-chung Yen, Plano, TX (US);

Inventors:

Chin-Hsiung Chang, Tai-Chung, TW;

Fu-Chung Yen, Plano, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

A measurement device. The measurement device comprises a note control component, adapted to obtain and record a note that is input with respect to a measuring event of the measurement device; and a Central Processing Unit (CPU), adapted to link the note with the measuring event.


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