The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2011

Filed:

May. 07, 2009
Applicants:

Fumi Kambara, Kawasaki, JP;

Yuji Yoshida, Kawasaki, JP;

Sugio Satoh, Kawasaki, JP;

Inventors:

Fumi Kambara, Kawasaki, JP;

Yuji Yoshida, Kawasaki, JP;

Sugio Satoh, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for analyzing a delay time distribution of an N-stage circuit. The method includes a delay time calculation step of calculating maximum deviation delay time of a signal propagating through the circuit and basic delay time of the circuit, a delay variation calculation step of calculating a delay variation value of the N-stage circuit by using the mean square of differences between the maximum deviation delay time of the circuit and the basic delay time of the circuit taken over the N stages, and a step of generating the delay time distribution of the N-stage circuit as a normal distribution by using the calculated delay variation value.


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