The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
Oct. 31, 2008
John H. Marquardt, Berthoud, CO (US);
Tahllee Baynard, Lafayette, CO (US);
John H. Marquardt, Berthoud, CO (US);
Tahllee Baynard, Lafayette, CO (US);
Lockheed Martin Coherent Technologies, Inc., Louisville, CO (US);
Abstract
Provided herein are systems and methods capable of detecting and discriminating and/or classifying hazardous biological agents or other hazardous agents. In one aspect, a system measures electromagnetic energy scattered by a material at the different polarizations states and wavelengths. The system then combines the measured electromagnetic wavelengths at the different polarization states and wavelengths into different combinations to produce input parameters for a classifier. The input parameters include both depolarization and wavelength-dependent elastic backscatter measurements of the material illuminated by transmitted electromagnetic energy. The combination of wavelength dependent depolarization measurements and wavelength dependent backscatter measurements provides a unique capability to classify (or discriminate) based on size, shape, and refractive index. The combined measurements provided in the input parameters increases the information available to the classifier to classify materials, enabling the classifier to classify a wider range of materials.