The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2011

Filed:

Jun. 06, 2008
Applicant:

Yoshio Nakagaki, Toyota, JP;

Inventor:

Yoshio Nakagaki, Toyota, JP;

Assignee:

Denso Corporation, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A failure-diagnosis information collection system facilitates failure diagnosis in a vehicle. Electronic control units (ECUs) constituting an onboard network perform abnormality detection processing for a detected abnormality. When a duration during which an abnormality recognizing condition for a detected abnormality is established reaches an abnormality recognition time, abnormality information and a principal time stamp associated with the time point are stored. When the abnormality recognizing condition is established for the first time, a first preliminary time stamp that is time-instant information associated with the time point is stored. When the duration during which the abnormality recognizing condition is established reaches half of the abnormality recognition time, a second preliminary time stamp that is time-instant information associated with the time point is stored. Consequently, an abnormality that is a major factor having triggered other multiple abnormalities can be readily identified based on the first and second preliminary time stamps.


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