The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2011

Filed:

Apr. 09, 2008
Applicants:

Masahito Watanabe, Utsunomiya, JP;

Takayuki Tsuji, Utsunomiya, JP;

Hiroshi Hattori, Utsunomiya, JP;

Nobuharu Nagaoka, Nasu-gun, JP;

Izumi Takatsudo, Utsunomiya, JP;

Masakazu Saka, Utsunomiya, JP;

Inventors:

Masahito Watanabe, Utsunomiya, JP;

Takayuki Tsuji, Utsunomiya, JP;

Hiroshi Hattori, Utsunomiya, JP;

Nobuharu Nagaoka, Nasu-gun, JP;

Izumi Takatsudo, Utsunomiya, JP;

Masakazu Saka, Utsunomiya, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for testing infrared cameras includes: a cover plate which has a plurality of holes formed therethrough and arranged in line in a horizontal direction at a regular interval, the cover plate being adapted to emit an amount of infrared light; and an emission source which is disposed in parallel to and behind the cover plate as viewed from infrared cameras to be tested, the emission source being adapted to emit a different amount of infrared light when compared with the cover plate.


Find Patent Forward Citations

Watanabe, Masahito. (2011). Apparatus and method for testing infrared camera (U.S. Patent No. 8077909). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8077909

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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