The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
Dec. 05, 2007
Applicants:
Haitao Xia, Santa Clara, CA (US);
Yenyu Hsieh, San Jose, CA (US);
Bac Pham, San Jose, CA (US);
Inventors:
Assignee:
Link—A—Media Devices Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
Detecting a defect on a storage device is disclosed. Detecting includes receiving a signal read from a storage device, sampling the signal to obtain a set of signal samples, wherein the sampling starts at an arbitrary time, computing a defect value for a defect type using the set of signal samples, comparing the defect value with a threshold associated with the defect type, determining whether there is a defect of the defect type based at least in part on the comparison, and in the event that a defect is detected, outputting an indication associated with the defect.