The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
Mar. 27, 2011
Hiroyuki Ominato, Nagoya, JP;
Hitoshi Fujino, Tajimi, JP;
Yoshifumi Nakamura, Nagoya, JP;
Hiroki Yukawa, Nagoya, JP;
Hiroyuki Ominato, Nagoya, JP;
Hitoshi Fujino, Tajimi, JP;
Yoshifumi Nakamura, Nagoya, JP;
Hiroki Yukawa, Nagoya, JP;
Brother Kogyo Kabushiki Kaisha, Nagoya-shi, Aichi-ken, JP;
Abstract
In a scanning optical apparatus including a single lens configured to convert a beam deflected by a polygon mirror into a spot-like image on a scanned surface, an angle β[deg] formed in a main scanning plane between the first optical axis and the second optical axis of the opposite lens surfaces of the lens satisfies the condition of −0.6<β≦−0.1, and at least one of the conditions −0.5<β<0 and −0.1<D<0.2 are satisfied where βindicates an angle [deg] formed in the main scanning plane between the first optical axis and a reference line perpendicular to the scanned surface, and Dindicates an amount of shift [mm] in the main scanning plane, of a point of intersection between the second optical axis and the exit-side lens surface, from the first optical axis.