The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2011

Filed:

Aug. 10, 2006
Applicant:

Wen-yung Huang, Miao-Li, TW;

Inventor:

Wen-Yung Huang, Miao-Li, TW;

Assignee:

Transpacific Systems, LLC, Wilmington, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01); G03F 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

In accordance with the present invention, a method for automatically identifying a scan area by a scanner is disclosed. The method comprises steps of scanning an original comprising an object, identifying the original to establish a location and a profile of the object in the original, displaying a preview window corresponding to the original, wherein a location and a profile of a confined area is exactly the location and the profile of the object, receiving a framed area selected from the preview window by user, wherein a portion of the framed area beyond the confined area is automatically removed to generate a scan area, and scanning the scan area. The present invention can also extend to a method for selecting a scan area by a user and a scanner with a feature of automatically identifying a scan area.


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