The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
Dec. 09, 2009
Michael Choma, Durham, NC (US);
Joseph A. Izatt, Raleigh, NC (US);
Audrey Ellerbee, Durham, NC (US);
Marinko Sarunic, Durham, NC (US);
Michael Choma, Durham, NC (US);
Joseph A. Izatt, Raleigh, NC (US);
Audrey Ellerbee, Durham, NC (US);
Marinko Sarunic, Durham, NC (US);
Duke University, Durham, NC (US);
Abstract
Structure profiles from optical interferometric data can be identified by obtaining a plurality of broadband interferometric optical profiles of a structure as a function of structure depth in an axial direction. Each of the plurality of interferometric optical profiles include a reference signal propagated through a reference path and a sample signal reflected from a sample reflector in the axial direction. An axial position corresponding to at least a portion of the structure is selected. Phase variations of the plurality of interferometric optical profiles are determined at the selected axial position. A physical displacement of the structure is identified based on the phase variations at the selected axial position.