The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
Oct. 11, 2007
Pawel Drabarek, Tiefenbronn, DE;
David Rychtarik, Stuttgart, DE;
Pawel Drabarek, Tiefenbronn, DE;
David Rychtarik, Stuttgart, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
An optical fiber probe for an interferometric measuring device having a mechanical receptacle into which an optical fiber is inserted, having a fiber end piece which projects over the mechanical receptacle and contains optical components for guiding a measuring beam onto a measuring object, and having a reflection zone situated in the fiber for partial reflection of a light beam guided in the fiber. The reflection zone is situated in the fiber end piece. A method for manufacturing such an optical fiber probe. The fiber is separated at a predefined point, a partially reflecting coating is applied to at least one of the separation sites, and the two fiber parts are subsequently reconnected. The optical fiber probes may thus be manufactured with a long fiber end piece, which makes it possible to interferometrically measure deep cavities having a small diameter.