The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
Jan. 29, 2007
Gordon C. Brown, Walpole, NH (US);
Michael Burka, Winchester, MA (US);
Brian Cranton, Sanbornton, NH (US);
David Erickson, Topsfield, MA (US);
James Grassi, Westwood, MA (US);
Matthew Patrick Hammond, Boston, MA (US);
Maximillan Ben Shaffer, Boston, MA (US);
Pierre Villeneuve, Winchester, MA (US);
Gordon C. Brown, Walpole, NH (US);
Michael Burka, Winchester, MA (US);
Brian Cranton, Sanbornton, NH (US);
David Erickson, Topsfield, MA (US);
James Grassi, Westwood, MA (US);
Matthew Patrick Hammond, Boston, MA (US);
Maximillan Ben Shaffer, Boston, MA (US);
Pierre Villeneuve, Winchester, MA (US);
Applied Instrument Technologies, Inc., Upland, CA (US);
Abstract
An optical apparatus for measurement of industrial chemical processes. The analyzer uses Raman scattering and performs measurement of chemical concentrations in continuous or batch processes. The analyzer operates at a standoff distance from the analyte (or analytes) and can measure concentrations through an optical port, facilitating continuous, non-destructive, and non-invasive analysis without extracting the analyte or analytes from the process. The analyzer can measure one or several solid, liquid, or gaseous analytes, or a mixture thereof.