The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2011

Filed:

Jun. 14, 2007
Applicants:

Alexander Berestov, San Jose, CA (US);

Ted J. Cooper, Sunnyvale, CA (US);

Inventors:

Alexander Berestov, San Jose, CA (US);

Ted J. Cooper, Sunnyvale, CA (US);

Assignees:

Sony Corporation, Tokyo, JP;

Sony Electronics Inc., Park Ridge, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/228 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of and system for calibrating an imaging device is described herein. An iterative method that attempts to find the best calibration parameters conditional upon an error metric is used. Regression is used to estimate values in a color space where the calibration is performed based upon a training data set. More calculation steps are required than would be for a regression in raw RGB space, but the convergence is faster in the color space where the calibration is performed, and the advantages using boundary conditions in the color space is able to provide improved calibration.


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