The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
Dec. 21, 2007
Moritz Kreysing, Hamm, DE;
Jochen Guck, Leipzig, DE;
Josef Kaes, Leipzig, DE;
Universitaet Leipzig, Leipzig, DE;
Abstract
The invention relates to a device for contactless manipulation and alignment of sample particles in a measurement volume using a nonhomogeneous electric alternating field, comprising a radiation source for emitting electromagnetic radiation and optical means for guiding the electromagnetic radiation into the measurement volume. The device is characterized in that the optical means include a beam shaping device for generating an intensity profile that is asymmetrical about the beam axis, wherein sample particles in the measurement volume can be trapped in a nonhomogeneous field distribution of the electric field generated by the asymmetrical intensity profile, that for the purpose of entraining sample particles trapped in the nonhomogeneous field distribution there is provided a rotating device to effect rotation of the asymmetrical intensity profile about the beam axis relatively to the measurement volume, and that the electromagnetic radiation beam in the measurement volume is unfocused, more particularly, divergent. The invention further relates to a method for contactless manipulation and alignment of sample particles in a measurement volume using a nonhomogeneous electric field.