The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
May. 12, 2006
Masayuki Hirose, Tokyo, JP;
Masashi Kameyama, Fukui, JP;
Yukihisa Hasegawa, Fukui, JP;
Nobuki Dohi, Fukui, JP;
Hong Zhang, Tokyo, JP;
Mitsuo Okumura, Tokyo, JP;
Masayuki Hirose, Tokyo, JP;
Masashi Kameyama, Fukui, JP;
Yukihisa Hasegawa, Fukui, JP;
Nobuki Dohi, Fukui, JP;
Hong Zhang, Tokyo, JP;
Mitsuo Okumura, Tokyo, JP;
H & B System Co., Ltd., Tokyo, JP;
The Kansai Electric Power Co., Inc., Osaka, JP;
Kozo Keikaku Engineering Inc., Tokyo, JP;
Abstract
A transmission probe and a reception probe for transmitting and receiving a wideband ultrasonic wave are provided. Each time when the locations of the probes and are moved, a received wave G(t) is obtained. Based on a spectrum F(f) corresponding to the received wave G(t), a narrowband spectrum FA(f) is extracted. A component wave GA(t) corresponding to the narrowband spectrum FA(f) is found by inverse Fourier transformation. A longitudinal wave primary resonance frequency fhaving a relationship with a thickness W (mm) of an inspection target and a primary resonance frequency fof a transverse wave generated by mode conversion are calculated. A comparative display of the component waves GA(t) is presented using f, fand sizing coefficients n, n, nand nfor high precision inspection. Based on the measurement point which shows a wave generation in the comparative screen of the component waves GA(t), it is determined that there is a flaw Z at a certain position inside the inspection target immediately below a line segment connecting the transmission probe and the reception probe.