The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2011
Filed:
Sep. 03, 2008
Katsumi Homma, Kawasaki, JP;
Katsumi Homma, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A leakage current analyzing apparatus receives input of data used for analysis and indicating intra/inter-chip variation concerning the gate length of transistors constituting cells in a circuit to be designed, where the inter-chip variation is handled as a discrete probability density distribution R. Using the data input, the leakage current analyzing apparatus obtains a cumulative probability density for a leakage current value (of the circuit) that is equal to or less than each arbitrary leakage current value Ito I. As a result, the leak rate of the circuit to be designed can be correctly obtained without limiting the shape of distribution.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile