The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2011

Filed:

Nov. 13, 2007
Applicants:

Jinendra K. Gugaliya, Bangalore, IN;

Ravindra D. Gudi, Bangalore, IN;

Jinyi MO, Shanghai, CN;

Guan Tien Tan, Penang, MY;

Inventors:

Jinendra K. Gugaliya, Bangalore, IN;

Ravindra D. Gudi, Bangalore, IN;

Jinyi Mo, Shanghai, CN;

Guan Tien Tan, Penang, MY;

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Multiple models for various stages of a non-linear process control are developed by clustering perturbation data obtained from the nonlinear process so as to permit multiple local data regions to be identified as a function of substantial similarity between the data, wherein the data of first data set represent the non-linear process. A discrete model corresponding to each of the local data regions is generated. The number of the discrete models may be reduced as a function of prediction error between actual outputs of the process and predicted outputs of the models and as a function of a gap metric based on closed loop similarity and frequency response similarity between the models.


Find Patent Forward Citations

Gugaliya, Jinendra. (2011). Decomposition of nonlinear dynamics using multiple model approach and gap metric analysis (U.S. Patent No. 8073659). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8073659

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