The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2011

Filed:

Jan. 23, 2009
Applicants:

Shuyi Chen, Urbana, IL (US);

William Sanders, Mahomet, IL (US);

Matti Hiltunen, Chatham, NJ (US);

Kaustubb Joshi, Scotch Plains, NJ (US);

Richard Schlichting, New Providence, NJ (US);

Inventors:

Shuyi Chen, Urbana, IL (US);

William Sanders, Mahomet, IL (US);

Matti Hiltunen, Chatham, NJ (US);

Kaustubb Joshi, Scotch Plains, NJ (US);

Richard Schlichting, New Providence, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring system response sensitivity, using live traffic and an analysis that converts randomly arriving stimuli and reactions to the stimuli to mean measures over chosen intervals, thereby creating periodically occurring samples that are processed. The system is perturbed in a chosen location of the system in a manner that is periodic with frequency p, and the system's response to arriving stimuli is measured at frequency p. The perturbation, illustratively, is with a square wave pattern.


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