The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2011

Filed:

Feb. 15, 2008
Applicants:

Bruce A. Thomson, Toronto, CA;

Yves Le Blanc, Newmarket, CA;

Inventors:

Bruce A. Thomson, Toronto, CA;

Yves Le Blanc, Newmarket, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Quantitation is performed using data from a mass spectrometer. A calibration ion mass spectrum is acquired for each of a plurality of known quantities of a material. From the calibration spectra a plurality of ions that identify the material is determined, and for each ion of the plurality of ions a linear range and linear function are determined. A sample ion mass spectrum is acquired for an unknown quantity of the material. A sample intensity is measured for each ion of the plurality of ions from the sample spectrum. After acquiring the sample spectrum, one or more ions are selected from the plurality of ions such that the sample intensity of each of the one or more ions is within a linear range of the ion. The unknown quantity is calculated from the sample intensities and linear functions of the one or more ions.


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