The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2011
Filed:
May. 30, 2008
Applicants:
Russell D. Mareachen, Winfield, IL (US);
Boaz J. Super, Westchester, IL (US);
Sek M. Chai, Streamwood, IL (US);
Tianli Yu, Foster City, CA (US);
Bei Tang, Palatine, IL (US);
Inventors:
Russell D. Mareachen, Winfield, IL (US);
Boaz J. Super, Westchester, IL (US);
Sek M. Chai, Streamwood, IL (US);
Tianli Yu, Foster City, CA (US);
Bei Tang, Palatine, IL (US);
Assignee:
General Instrument Corporation, Horsham, PA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/34 (2006.01);
U.S. Cl.
CPC ...
Abstract
Described herein are systems and methods for expanding upon the single-distance-based background denotation to seamlessly replace unwanted image information in a captured image derived from an imaging application so as to account for a selected object's spatial orientation to maintain an image of the selected object in the captured image.