The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2011
Filed:
Jan. 19, 2010
Tatsuo Nakata, Bethlehem, PA (US);
Tatsuo Nakata, Bethlehem, PA (US);
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A microscope apparatus includes a first optical system which illuminates a sample via an objective lens with light output from a light source and which detects fluorescence emitted from the sample via the objective lens, and a second optical scanning system which irradiates specific regions of the sample with a laser beam output from a laser light source, thereby causing a particular phenomenon. The first optical system may include a rotatable disk to obtain a confocal effect, and the light output from the light source scans the sample via the rotatable disk, and the fluorescence is detected via the rotatable disk. A depth position of a focal plane of the second optical scanning system is generally the same as a depth position of a focal plane of the first optical system.