The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2011
Filed:
Jun. 02, 2008
Paul G. Vahey, Seattle, WA (US);
Gregory J. Werner, Puyallup, WA (US);
Wes W. Quigley, Auburn, WA (US);
Paul H. Shelley, Lakewwod, WA (US);
Paul G. Vahey, Seattle, WA (US);
Gregory J. Werner, Puyallup, WA (US);
Wes W. Quigley, Auburn, WA (US);
Paul H. Shelley, Lakewwod, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A system and method for measuring coating thickness upon a substrate containing directionally oriented elements is disclosed. A near infrared light is directed upon the coating and reflected near infrared light is collected to determine the coating thickness. A pair of stacked and crossed diffuser elements is placed between the light source and the sample, and between the sample and the reflected near infrared light collector to improve the accuracy of the measurement, especially for coating thickness of less than about 2 mils and for coatings on substrates containing directionally oriented components. Each diffuser element is formed of a polytetrafluoroethylene fluoropolymer (PTFE) film.