The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2011

Filed:

Jun. 18, 2008
Applicants:

Bryan D. Ackland, Old Bridge, NJ (US);

Paul W. Latham, Ii, Lee, NH (US);

Joshua C. Park, Billerica, MA (US);

Inventors:

Bryan D. Ackland, Old Bridge, NJ (US);

Paul W. Latham, II, Lee, NH (US);

Joshua C. Park, Billerica, MA (US);

Assignee:

Infrared Newco, Inc., Tucson, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/335 (2011.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus are provided for performing multiple correlated double sampling (CDS) operations on an imaging pixel, and in some cases on an array of imaging pixels, during a single integration cycle of the pixel(s). The multiple CDS operations may produce multiple CDS values, which may be processed in combination to produce a resulting value substantially free of various types of noise. The CDS operations may be performed using a CDS circuit including a single-ended charge amplifier having an input capacitor. The charge amplifier may also include a variable capacitance providing a variable gain. The variable capacitance may be provided by a feedback capacitor.


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