The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2011

Filed:

Feb. 18, 2011
Applicant:

Makoto Tomioka, Tokyo, JP;

Inventor:

Makoto Tomioka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2006.01); A61B 1/04 (2006.01); G02B 23/00 (2006.01); G02B 23/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is an endoscope optical system including first deflecting means that deflects light incident along an incident optical axis in a direction along a first axis perpendicular to the incident optical axis and emits the light; second deflecting means having two reflecting faces that fold back the light emitted from the first deflecting means along a second axis separated from the first axis by a gap; and third deflecting means that deflects the light folded back by the second deflecting means in a direction perpendicular to the first axis and along a plane including the incident optical axis, wherein the first deflecting means is provided so as to be capable of swiveling about the first axis relative to the second deflecting means, and the two reflecting faces of the second deflecting means are disposed to form an obtuse angle therebetween.


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