The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2011

Filed:

May. 25, 2007
Applicants:

Sang-oak Woo, Anyang-si, KR;

Do-kyoon Kim, Seongnam-si, KR;

Kee-chang Lee, Yongin-si, KR;

Jeong-hwan Ahn, Suwon-si, KR;

Se-yoon Tak, Yongin-si, KR;

Sergey U. Belyaev, Saint Petersburg, RU;

Inventors:

Sang-Oak Woo, Anyang-si, KR;

Do-Kyoon Kim, Seongnam-si, KR;

Kee-Chang Lee, Yongin-si, KR;

Jeong-Hwan Ahn, Suwon-si, KR;

Se-Yoon Tak, Yongin-si, KR;

Sergey U. Belyaev, Saint Petersburg, RU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A 3D graphics processing method includes receiving a homogeneous coordinate and an attribute value of both end points of one scan line of a polygon composed of a plurality of perspective projected vertices, calculating a reference value indicating an amount of perspective distortion in the scan line using the received homogeneous coordinates, and interpolating an attribute value of each of pixels of the scan line using at least some of the received homogeneous coordinates and attribute values, the attribute value interpolated by selectively applying perspective correction to each pixel based on the reference value.


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