The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2011
Filed:
May. 26, 2009
Richard K. Martin, Springboro, OH (US);
Jamie S. Velotta, Athens, AL (US);
John F. Raquet, New Carlisle, OH (US);
Richard K. Martin, Springboro, OH (US);
Jamie S. Velotta, Athens, AL (US);
John F. Raquet, New Carlisle, OH (US);
The United States of America as represented by the Secretary of the Air Force, Washington, DC (US);
Abstract
A multicarrier modulation position determination method that includes deploying at least one known receiver with a known location and a second receiver with an unknown location. At least two signals of opportunity with different locations are obtained by both the receiver and the second receiver. The signals having a plurality of block data, the block data having block boundaries. The block boundaries including a beginning block boundary and an end block boundary. The block data further including a cyclic prefix at the beginning block boundary. Acquiring a plurality of data samples for at least a portion of the block data and correlating the attained signal of opportunity between the receivers. The correlating process includes the calculation of a time difference of arrival between the known receiver and the second receiver. The time difference of arrival is calculated by aligning the block boundaries and computing a single scalar statistical feature associated with each block. The location of the second receiver is calculated by using a plurality of single scalar statistical features.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile