The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2011
Filed:
Feb. 12, 2010
David G. Watson, Eden Prairie, MN (US);
Paul E. Larson, Bloomington, MN (US);
Dennis F. Paul, Eden Prairie, MN (US);
Ronald E. Negri, Minnetonka, MN (US);
David G. Watson, Eden Prairie, MN (US);
Paul E. Larson, Bloomington, MN (US);
Dennis F. Paul, Eden Prairie, MN (US);
Ronald E. Negri, Minnetonka, MN (US);
Physical Electronics USA, Inc., Chanhassen, MN (US);
Abstract
A sample holder apparatus and method for reducing the energy of charged particles entering an annular-acceptance analyzer includes use of an electrically isolated sample support member having a sample receiving surface configured to receive a sample and electrically connect the sample to the sample support member (e.g., wherein the sample support member is configured for application of a retarding bias potential). A grounded sample aperture member defining an aperture relative to the sample support member but electrically isolated therefrom is provided such that the aperture is proximate the sample receiving surface to expose at least a portion of a surface of a sample received thereon to be analyzed (e.g., wherein applying a retarding bias potential to the sample support member produces an electrical retarding field about the aperture that reduces the energy of emitted particles from a sample before they enter an annular-acceptance analyzer).