The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2011

Filed:

Oct. 07, 2008
Applicants:

David W. Burke, Indianapolis, IN (US);

Terry A. Beaty, Indianapolis, IN (US);

Lance S. Kuhn, Fishers, IN (US);

Vladimir Svetnik, Morristown, NJ (US);

Inventors:

David W. Burke, Indianapolis, IN (US);

Terry A. Beaty, Indianapolis, IN (US);

Lance S. Kuhn, Fishers, IN (US);

Vladimir Svetnik, Morristown, NJ (US);

Assignee:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/50 (2006.01); G01N 31/00 (2006.01); G01N 27/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Control and calibration solutions are described that provide control and calibration data that is recognized by a test meter allowing the meter to segregate the control and calibration data from regular test data. Recognition and segregation of the control and calibration data can occur automatically with no additional input from the meter's user. Methods for use of the solutions are also provided.


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