The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2011

Filed:

Mar. 27, 2008
Applicants:

Yuji Wakamiya, Kobe, JP;

Tomohiro Okuzaki, Himeji, JP;

Hisato Takehara, Kobe, JP;

Inventors:

Yuji Wakamiya, Kobe, JP;

Tomohiro Okuzaki, Himeji, JP;

Hisato Takehara, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01); G01N 33/00 (2006.01); G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sample analyzer and sample analyzing method perform following: a) mixing a sample with at least one of a first reagent and a second reagent, thereby preparing a measurement specimen; b) storing, in a memory, standard curve data corresponding to a reagent to be used in the step a) for preparing a measurement specimen; c) measuring the measurement specimen thereby obtaining measurement data; d) processing the measurement data based on the standard curve data, thereby obtaining an analysis result; and e) when the first, reagent and the second reagent are of the same type, determining a reagent to be used for the measuring between the first reagent and the second reagent, based on information regarding standard curve data stored in the memory.


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