The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2011
Filed:
Jul. 02, 2010
Fault identification of multi-host complex systems with timesliding window analysis in a time series
Fulu LI, Foster City, CA (US);
Mohsin Beg, Foster City, CA (US);
Sameer Joshi, San Jose, CA (US);
Weihsin Gu, San Mateo, CA (US);
Michael Zoll, Foster City, CA (US);
Angelo Pruscino, Los Altos, CA (US);
Fulu Li, Foster City, CA (US);
Mohsin Beg, Foster City, CA (US);
Sameer Joshi, San Jose, CA (US);
WeiHsin Gu, San Mateo, CA (US);
Michael Zoll, Foster City, CA (US);
Angelo Pruscino, Los Altos, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A method and apparatus is provided for determining the most probable cause of a problem observed in a complex multi-host system. The approach relies on a probabilistic model to represent causes and effects in a complex computing system. However, complex systems include a multitude of independently operating components that can cause temporary anomalous states. To reduce the resources required to perform root cause analysis on each transient failure, as well as to raise the confidence in the most probable cause of a failure that is identified by the model, inputs to the probabilistic model are aggregated over a sliding window of values from the recent past.