The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2011

Filed:

Aug. 19, 2008
Applicants:

Esmail Hejazi Dinan, Herndon, VA (US);

Jong-hak Jung, Herndon, VA (US);

Swati Tiwari, Fairfax, VA (US);

Hemanth Balaji Pawar, Herndon, VA (US);

Krishna D. Sitaram, Chantilly, VA (US);

Inventors:

Esmail Hejazi Dinan, Herndon, VA (US);

Jong-hak Jung, Herndon, VA (US);

Swati Tiwari, Fairfax, VA (US);

Hemanth Balaji Pawar, Herndon, VA (US);

Krishna D. Sitaram, Chantilly, VA (US);

Assignee:

Clear Wireless LLC, Kirkland, WA (US);

Attorney:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 36/00 (2009.01); H04W 24/00 (2009.01); H04W 4/00 (2009.01); H04M 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A mobile communication device wirelessly transfers user communications to a first wireless base station. The mobile communication device determines a first metric based on a load indicator for the first base station. The mobile communication device identifies a second wireless base station and determines a second metric based on a load indicator for the second base station. If the second metric is superior to the first metric, the mobile communication device determines if the second base station has sufficient performance characteristics for communication with the device. If the performance is sufficient, the mobile communication device initiates a hand-off from the first base station to the second base station. The mobile communication device may use additional factors to determine the first and second metrics.


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