The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2011
Filed:
May. 27, 2008
Dinesh R. Nair, Austin, TX (US);
Nicolas Vazquez, Austin, TX (US);
Robert J. B. Giesen, Austin, TX (US);
Joshua B. Keeler, Austin, TX (US);
Bruce Smyth, Hollis, NH (US);
Dinesh R. Nair, Austin, TX (US);
Nicolas Vazquez, Austin, TX (US);
Robert J. B. Giesen, Austin, TX (US);
Joshua B. Keeler, Austin, TX (US);
Bruce Smyth, Hollis, NH (US);
National Instruments Corporation, Austin, TX (US);
Abstract
System and method for characterizing vision systems. A multi-dimensional condition space is provided, each dimension representing a respective condition axis, where each point in the condition space specifies a set of conditions under which a vision system may operate. An image is provided. The condition space is sampled according to a pseudo-random sequence, e.g., a low-discrepancy sequence, to determine a plurality of test conditions usable to characterize the vision system, where each test condition corresponds to a respective set of conditions. A plurality of test images corresponding to the plurality of test conditions are generated based on the image, e.g., by applying image processing functions to the image that simulate the test conditions. A vision inspection is performed on each of the plurality of test images to generate respective test results, and the test results are analyzed to determine conditions under which the vision system operates correctly.