The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2011
Filed:
Nov. 19, 2010
Stephen L. Schultz, West Henrietta, NY (US);
Frank D. Giuffrida, Honeoye Falls, NY (US);
Robert L. Gray, Canandaigua, NY (US);
Charles Mondello, Pittsford, NY (US);
Stephen L. Schultz, West Henrietta, NY (US);
Frank D. Giuffrida, Honeoye Falls, NY (US);
Robert L. Gray, Canandaigua, NY (US);
Charles Mondello, Pittsford, NY (US);
Pictometry International Corp., Rochester, NY (US);
Abstract
A computerized system for displaying and making measurements based upon captured oblique images. The system includes a computer system executing image display and analysis software. The software reads a plurality of captured oblique images having corresponding geo-location data and a data table storing ground plane data that approximates at least a portion of the terrain depicted within the captured oblique images. The executed software causes the computer system to receive a starting point selected by a user, receive an end point selected by the user and calculate a desired measurement between the starting and end points dependent upon the geo-location data and ground plane data. The desired measurement is selected from a group consisting of a distance measuring mode, a height measuring mode, and a relative elevation measuring mode.