The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2011
Filed:
Feb. 27, 2009
Harumitsu Miyashita, Nara, JP;
Kohei Nakata, Nara, JP;
Yasumori Hino, Nara, JP;
Naohiro Kimura, Kyoto, JP;
Harumitsu Miyashita, Nara, JP;
Kohei Nakata, Nara, JP;
Yasumori Hino, Nara, JP;
Naohiro Kimura, Kyoto, JP;
Panasonic Corporation, Osaka, JP;
Abstract
A signal evaluation method according to the present invention is a method for evaluating a read signal, retrieved from an information recording medium, based on a binarized signal generated from the read signal by a PRML method. The method includes the steps of: detecting the patterns of multiple paths associated with the binarized signal and merging into the same state; getting the ideal value of a correct pattern associated with the binarized signal and that of an erroneous pattern that is similar to, but different from, the correct pattern; calculating the difference between a distance from the ideal value of the correct pattern to the read signal and a distance from that of the erroneous pattern to the read signal; calculating, based on the difference, an expected error rate for each predetermined group of patterns by the PRML method; and calculating a standard deviation that is associated with a total error rate, which is obtained by adding together the error rates of the predetermined groups of patterns, and that is used for evaluating the read signal.