The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2011

Filed:

Apr. 23, 2007
Applicants:

Douglas V. Baker, Middleville, MI (US);

John Calow, Plainwell, MI (US);

Inventors:

Douglas V. Baker, Middleville, MI (US);

John Calow, Plainwell, MI (US);

Assignee:

X-Rite, Inc., Grand Rapids, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/21 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are disclosed for positioning or storing an electro-optical instrument (e.g., spectrophotometer) within a printing device to facilitate calibration or maintenance of the instrument. In various embodiments, the electro-optical instrument may be pivoted or moved to an inclined position to facilitate calibration of the instrument relative to one or more calibration references. The electro-optical instrument may also be moved or inclined along a travel path in the printing device to a position or positions adjacent to various calibration references.


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