The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2011
Filed:
Feb. 24, 2010
Stephen R King, Santa Cruz, CA (US);
Mathew N. Rekow, Santa Cruz, CA (US);
Paul S. Carlson, Santa Cruz, CA (US);
Thomas Heinke, Santa Cruz, CA (US);
Stefan H. Warnke, Santa Cruz, CA (US);
Betsy Brest, Boulder Creek, CA (US);
Stephen R King, Santa Cruz, CA (US);
Mathew N. Rekow, Santa Cruz, CA (US);
Paul S. Carlson, Santa Cruz, CA (US);
Thomas Heinke, Santa Cruz, CA (US);
Stefan H. Warnke, Santa Cruz, CA (US);
Betsy Brest, Boulder Creek, CA (US);
Fluke Corporation, Everett, WA (US);
Abstract
An infrared imaging system having functionality for maintaining image quality in the presence of temperature drift of the system. Such functionality is applied repetitively to maintain image quality of a target scene, yet without continuous actuation of a shutter of the system. The functionality of the imaging system results from implementing an imager algorithm. In use, the imager algorithm functions with a calibration curve created for the imaging system, with the curve comprising a plot of system output versus target scene temperature.