The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2011
Filed:
Feb. 22, 2008
Bruce A. Thomson, Toronto, CA;
Yves Le Blanc, Newmarket, CA;
Bruce A. Thomson, Toronto, CA;
Yves Le Blanc, Newmarket, CA;
DH Technologies Development Pte. Ltd., Singapore, SG;
Abstract
Selectivity of a measurement from a mass spectrometer is improved by selecting an extracted ion current window for the measurement after data acquisition. A plurality of mass spectra are acquired over a period of time. A first extracted ion current window is selected and from the plurality of mass spectra a first intensity as a function of time is calculated for an ion using the first extracted ion current window. A second extracted ion current window is selected and from the plurality of mass spectra a second intensity as a function of time is calculated for the ion using the second extracted ion current window. A first signal-to-noise ratio of the first intensity is compared with a second signal-to-noise ratio of the second intensity. If the second signal-to-noise ratio is greater than the first signal-to-noise ratio, the second intensity as a function of time is used for the measurement.