The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2011
Filed:
Jun. 11, 2009
Daniel Gazaille, Palmer, MA (US);
Paresh Kitchloo, North Attleboro, MA (US);
Russell F. Weymouth, Jr., Charlton, MA (US);
Daniel Gazaille, Palmer, MA (US);
Paresh Kitchloo, North Attleboro, MA (US);
Russell F. Weymouth, Jr., Charlton, MA (US);
Gentex Optics, Inc., Carbondale, PA (US);
Abstract
Optical qualities of a production lot of base material used in the fabrication of semi-finished lenses may be accurately determined by employing chipper plate samples produced from the base material in accordance with aspects of the present invention. In various implementations of the present invention, the chipper plates samples may be fabricated by subjecting base material to an extended cycle time and temperature profile using a mold having cavities of different thicknesses. The resulting chipper plates provide an improved indication of the color of semi-finished lenses molded from the production lot as well as an improved indication of resin stabilizer defects that may be utilized during a pelletizing process to control and enhance the quality of a production lot. Furthermore, the chipper plates may be provided by suppliers as samples of a production lot to enable customers to base purchasing decisions on a reliable and accurate measure of optical properties.