Automatically creating manufacturing test rules pertaining to an electronic component

Abstract

A system for creating manufacturing test rules. Stimuli for an electronic design are generated automatically by a stimuli generator. The stimuli generator takes into account certain limitations of the design when automatically generating the manufacturing test rules. The design is tested by a testbench using the stimuli. A simulation log for the design is generated by the testbench. The simulation log is then processed by a simulation log processor. An HDL representation of the design is generated by the simulation log processor using the processed simulation log. A gate-level version of the design is generated by a synthesis tool using the HDL representation of the design. The gate-level version of the design is further processed by the synthesis tool to make any necessary modifications. Then, the gate-level version of the design is outputted as the final manufacturing test rule. Thus, creating manufacturing test rules can be completely automated.