The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2011
Filed:
Dec. 05, 2007
Applicants:
Luping Ding, Worcester, MA (US);
Songting Chen, San Jose, CA (US);
Elke a Rundensteiner, Worcester, MA (US);
Junichi Tatemura, Sunnyvale, CA (US);
Wang-pin Hsiung, Santa Clara, CA (US);
Inventors:
Luping Ding, Worcester, MA (US);
Songting Chen, San Jose, CA (US);
Elke A Rundensteiner, Worcester, MA (US);
Junichi Tatemura, Sunnyvale, CA (US);
Wang-Pin Hsiung, Santa Clara, CA (US);
Assignee:
NEC Laboratories America, Inc., Princeton, NJ (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and method are disclosed for applying a query to an event stream by storing one or more event constraints; performing constraint aware complex event processing on the query and the event constraints; and optimizing the query at run time.