The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2011

Filed:

Feb. 03, 2009
Applicants:

Mostafa A. Karam, Moorpark, CA (US);

Charles H. Volk, Newbury Park, CA (US);

A. Douglas Meyer, Woodland Hills, CA (US);

Inventors:

Mostafa A. Karam, Moorpark, CA (US);

Charles H. Volk, Newbury Park, CA (US);

A. Douglas Meyer, Woodland Hills, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 17/00 (2006.01); G01N 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

One embodiment of the invention includes a system for measuring at least one thermal property of a material. The system includes a thermal source configured to generate an incident thermal wave that propagates through a medium and is provided onto the material at an incident angle. The system also includes a thermal detector that is configured to receive a reflected thermal wave corresponding to the incident thermal wave reflected from the material at a reflection angle that is approximately equal to the incident angle. The system further includes a controller configured to control a magnitude of the incident angle to ascertain a thermal Brewster angle of the material and to calculate the at least one thermal property of the material based on the thermal Brewster angle.


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